蔡烁
发布时间: 2024-02-28 10:52:29 浏览量:
长沙理工大学计算机与通信工程学研究生导师基本信息表 |
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1、个人基本信息: |
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姓 名:蔡烁 |
性 别:男 |
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出生年月:1982年10月 |
技术职称:教授 |
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毕业院校:湖南大学 |
学历(学位):博士 |
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所在学科:计算机科学与技术、信息与通信工程 |
研究方向:容错计算、电路系统可靠性、集成电路抗辐射加固设计、人工智能、物联网可靠性 |
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2、教育背景: |
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浙江大学 |
信息工程,学士 |
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2004.9-2007.6 |
湖南大学 |
信号与信息处理,硕士 |
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2010.9-2015.4 |
湖南大学 |
计算机科学与技术,博士 |
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3、目前研究领域: |
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容错计算、近似计算、电路系统可靠性、集成电路抗辐射加固、人工智能、物联网可靠性。 |
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4、已完成或已在承担的主要课题: |
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[1] 国家自然科学基金面上项目:基于相关性分离的逻辑电路失效率高效分析与敏感目标精准定位,2022.1-2025.12,No:62172058,主持,在研; [2] 湖南省自然科学基金杰出青年基金项目:空间辐射环境下纳米集成电路可靠性评估与加固设计,2022.1-2024.12,No:2022JJ10052,主持,在研; [3] 湖南省自然科学基金面上项目:面向逻辑级超大规模集成电路软错误率分析方法研究,2020.1-2022.12,主持,No:2020JJ4622,主持,已完成; [4] 国家自然科学基金青年项目:逻辑级破解纳米集成电路软错误可靠性评估难题的新方法,2018.1-2020.12,No:61702052,主持,已完成; [5] 湖南省教育厅重点项目:空间辐射环境下纳米集成电路瞬态故障分析与可靠性评估,2019.9-2021.8,No:18A137,主持,已完成; [6] 湖南省水利科技项目:大坝病害快速诊断与动态风险控制决策研究,2020.7-2022.6,No:XSKJ2019081-47,主持,已完成。 |
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6、已发表的学术论文: |
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[1] 蔡烁*, 何辉煌, 余飞, 尹来容, 刘洋. 基于相关性分离的逻辑电路敏感门定位算法. 电子与信息学报. 2024, 46(1): 362-372 [2] Shuo Cai*, Yan Wen, Caicai Xie, Weizheng Wang, Fei Yu. Low-power and high-speed SRAM Cells for Double-Node-Upset Recovery. Integration, the VLSI Journal. 2023, 91:1-9 [3] Shuo Cai*, Yan Wen, Jiangbiao Ouyang, Weizheng Wang, Fei Yu, Bo Li. A Highly Reliable and Low-Power Cross-Coupled 18T SRAM Cell. Microelectronics Journal. 2023, 134:105729:1-7 [4] Shuo Cai, Tingyu Luo, Fei Yu*, Pradip Kumar Sharma, Weizheng Wang, Lairong Yin. Reliability Analysis of Correlated Competitive and Dependent Components Considering Random Isolation Times. CMC: Computer, Materials & Continua. 2023, 76(3): 2763-2777 [5] Shuo Cai*, Jiangbiao Ouyang, Yan Wen, Weizheng Wang, Fei Yu. A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design. 2023 IEEE 32nd Asian Test Symposium(ATS), Beijing, China, 2023,10.14-17: 1-5 [6] Shuo Cai*, Caicai Xie, Yan Wen, Weizheng Wang, Fei Yu, Lairong Yin. Four-input-C-element-based Multiple-Node-Upset-Self-Recoverable Latch Designs. Integration, the VLSI Journal. 2023, 90:11-21 [7] Shuo Cai*, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation. Journal of Electronic Testing-Theory and Applications. 2022, 38(2): 165-180 [8] Shuo Cai*, Sicheng Wu, Weizheng Wang, Fei Yu, Lairong Yin. Sensitive Vector Search for Logic Circuit Failure Probability based on Improved Adaptive Cuckoo Algorithm. Journal of Semiconductor Technology and Science. 2022, 22(2): 69-83 [9] Fei Yu, Xinxin Kong, Huifeng Chen, Qiulin Yu, Shuo Cai*, Yuanyuan Huang, Sichun Du. A 6D Fractional-Order Memristive Hopfield Neural Network and its Application in Image Encryption. Frontiers in Physics. 2022, 10: 847385, 1-14 [10] Fei Yu, Huifeng Chen, Xinxin Kong, Qiulin Yu, Shuo Cai*, Yuanyuan Huang, Sichun Du. Dynamic Analysis and Application in Medical Digital Image Watermarking of a New Multi-scroll Neural Network with Quartic Nonlinear Memristor. European Physical Journal Plus. 2022, 137(4): 434 [11] Shuo Cai*, Caicai Xie, Yan Wen, Weizheng Wang. A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. 5th IEEE International Test Conference in Asia, ITC-Asia 2021. 中国上海, 2021 [12] Shuo Cai*, Binyong He, Weizheng Wang, et al. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. Journal of Electronic Testing-Theory and Applications. 2020, 36(4): 469-483 [13] Shuo Cai*, Binyong He, Sicheng Wu, et al. An Accurate and Efficient Approach for Estimating the Failure Probability of Logic Circuits, 2020 CCF Integrated Circuit Design and Automation Conference, 2020: 1-15 [14] Shuo Cai*, Weizheng Wang, Fei Yu, Binyong He. Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits. Journal of Electronic Testing - Theory and Applications. 2019, 35(2): 163-172 [15] Shuo Cai*, Fei Yu, Yiqun Yang. Analysis of SET Pulses Propagation Probabilities in Sequential Circuits, 2017 the 4th International Conference on Advances in Electronics Engineering, 2017: 1-6 [16] Shuo Cai*, Yinbo Zhou, Peng Liu, Fei Yu, Wei Wang. A Novel Test Data Compression Approach Based on Bit Reversion. IEICE Electronics Express. 2017, 14(13): 1-11 [17] Shuo Cai*, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, Wei Wang. Reliability Evaluation of Logic Circuits Based on Transient Faults Propagation Metrics. IEICE Electronics Express. 2017, 14(7): 1-7 [18] Cai Shuo, Kuang Jishun*, Liu Tieqiao, Wang Weizheng. Soft Error Susceptibility Analysis for Sequential Circuit Elements Based on EPPMs. Journal of Semiconductor Technology and Science. 2015, 15(2): 168-176 [19] 蔡烁*,邝继顺,张亮,刘铁桥,王伟征.基于差错传播概率矩阵的时序电路软错误可靠性评估.计算机学报. 2015, 38(5): 923-931 [20] 蔡烁*,邝继顺,刘铁桥,凌纯清,尤志强.基于伯努利分布的逻辑电路可靠度计算方法.电子学报. 2015, 43(11):2292-2297 [21] 蔡烁*,邝继顺,刘铁桥,王伟征.考虑信号相关性的逻辑电路可靠度计算方法.电子学报.2014, 42(8): 1660-1664 [22] 蔡烁*,邝继顺,刘铁桥,周颖波.一种高效的门级电路可靠度估算方法.电子与信息学报. 2013, 35(5): 1262-1266 [23] 蔡烁*,胡航滔,王威.基于深度卷积网络的高分遥感图像语义分割.信号处理, 2019. 35(12): 2010-2016 |
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7、 所获学术荣誉及学术影响: |
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[1] 湖南省杰出青年基金项目获得者 [2] 湖南省青年骨干教师培养对象 [3] 中国计算机学会高级会员 [4] 中国计算机学会容错计算专委会执行委员 [5] 中国通信学会会员 [6] 湖南省计算机学会理事 [7] 湖南省人工智能学会会员 |
电子邮箱:caishuo@csust.edu.cn