以第一作者发表相关论文15篇。其中，SCI检索国际期刊论文11篇，EI检索期刊论文3篇（含国内权威期刊《计算机研究与发展》1篇），国际会议International MultiConference of Engineers and Computer Scientists论文1篇： [1] Weizheng Wang, Zhuo Deng, Jin Wang. Enhancing Sensor Network Security with Improved Internal Hardware Design, Sensors, 2019, 19, 1752. (SCI) [2] Weizheng Wang, Jincheng Wang, Wei Wang, Peng Liu, Shuo Cai. A Secure DFT Architecture Protecting Crypto Chips Against Scan-Based Attacks, IEEE Access, 2019, 7: 22206-22213. (SCI) [3] Weizheng Wang, Zhuo Deng, Jin Wang. Securing Cryptographic Chips Against Scan-based attacks in Wireless Sensor Network Applications, Sensors, 2019, 19, 4598. (SCI) [4] Weizheng Wang, Jincheng Wang, Zengyun Wang, Lingyun Xiang. Access-in-turn test architecture for low-power test application, International Journal of Electronics, 2017, 104(3): 433~441. (SCI) [5] Weizheng Wang, Jincheng Wang, Shuo Cai, Wei Su, Lingyun Xiang. Compression-friendly low power test application based on scan slices reusing, Journal of Semiconductor Technology and Science, 2016, 16(4): 463~469. (SCI) [6] Weizheng Wang, Cai Shuo, Lingyun Xiang. SOC Test Compression Scheme Sharing Free Variables in Embedded Deterministic Test environment, Journal of Semiconductor Technology and Science, 2015, 15(3): 397-403. (SCI) [7] Weizheng Wang, Cai Shuo, Lingyun Xiang. Scan Power-Aware Deterministic Test Scheme Using a Low-Transition Linear Decompressor. International Journal of Electronics, Vol. 102, No. 4, pp: 651-667, 2015 (SCI) [8] Weizheng Wang, Cai Shuo, Lingyun Xiang. Reducing Test Power and Improving Test Effectiveness for Logic BIST, Journal of Semiconductor Technology and Science, Vol. 14, No. 5, pp: 640-648,2014. (SCI) [9] Weizheng Wang, Liu Peng, Cai Shuo, Lingyun Xiang. Low power logic BIST with high test effectiveness. IEICE Electronics Express, Vol. 10, No. 23, pp: 1-6, 2013. (SCI) [10] Weizheng Wang, Jishun Kuang, Liu Peng, Xin Peng, Zhiqiang You. Switching activity reduction for scan-based BIST using weighted scan input data. IEICE Electronics Express, Vol. 9, No. 10, pp: 874-880, 2012. (SCI) [11] Weizheng Wang, Jishun Kuang, Zhiqiang You. Achieving low capture and shift power in linear decompressor-based test compression environment, Microelectronics Journal, Vol. 43, No. 1, pp: 143-140, 2012. (SCI) [12] 王伟征,邝继顺,尤志强, 刘鹏. 一种基于扫描子链轮流扫描捕获的低费用BIST方法, 计算机研究与发展, 第49卷, 第4 期, 864-872 页, 2012. (EI) [13] Weizheng Wang, Jishun Kuang, Zhiqiang You, Liu Peng. Reducing Test-Data Volume and Test-Power Simultaneously in LFSR Reseeding-based Compression Environment, Journal of semiconductors, Vol. 32, No. 7, pp: 075009(1)-075009(7), 2011. (EI) [14] Weizheng Wang, Jishun Kuang, Zhiqiang You. Low Power Compression in linear decompressor-based test compression environment. International Review on Computers and Software, Vol. 6, No. 4, pp: 550-554, 2011. (EI) [15] Weizheng Wang, Jincheng Wang, Shuo Cai, Peng Liu, Tieqiao Liu. A Low-Area Overhead Secure Scan Architecture Resisting Scan-Based Attacks for Crypto Chips, Proceedings of the International MultiConference of Engineers and Computer Scientists (IMECS 2017), Hong Kong, March 15-17. |
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